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Organisation
Programme
Scientific Programme Committee
Programme (PDF)
Table Top Presentation
Authors
Proceedings
Mo.1 - X-ray Sources
Mo.2 - Dimensional Computed Tomography
Mo.3 - Optimisation of Computed Tomography
Mo.4 - Computed Tomography Applications
Tu.1 - Phase Contrast Imaging
Tu.2 - Radiographic Simulation
Tu.3 - µCT Applications
Tu.4 - Qualification
We.1 - Film Replacement and Standards
We.2 - Other X-ray Applications
We.3 - 3D Reconstruction Algorithms
We.4 - Image Processing
Poster
List of Authors
Licenses
International Symposium on
Digital Industrial Radiology and Computed Tomography
June 20-22, 2011, Berlin
Programme
Scientific Programme Committee
Scientific Programme Committee
Markus Bartscher, PTB, Braunschweig
Klaus Bavendiek, YXLON, Hamburg
Steve Burch,ESR Technology, UK
Cliff Bueno, GE GRC, Niskayuna, US
Bernhard Illerhaus, BAM, Berlin
Stefan Kasperl, EZRT, Fürth
Michael Maisl, IzfP, Saarbrücken
Eberhard Neuser, GE S&T, Wunstorf
Reinhold Oster, Eurocopter, München
Christoph Sauerwein, RayScan, Meersburg
Martin Simon, WENZEL Volumetrik, Singen
Jürgen Stephan, Siemens, München
Valerie Kaftandjian, INSA, France
Jürgen Goebbels, BAM, Berlin
Uwe Zscherpel, BAM, Berlin
Thomas Bonin, France
Christian Thiery, CEA/DAM, France