This international symposium is devoted to promote a broad exchange of information on technologies, applications, quality assurance and standards in the area of digital industrial radiology and computed tomography. The meeting provides a unique opportunity for users, scientists, equipment suppliers and all who are interested to discuss the present and future possibilities for industrial applications of the following topics:
- X-ray detectors and sources
- radiography (multi-angle)
- Computed Tomography
- Laminography & Tomosynthesis
- Dual and multi-energies
- Phase contrast
- Image processing algorithms
- Quantitative imaging
- Modelling
- Data fusion
- Scattering
- Defect detection & localisation
- Feature extraction
- Dimensional control
- Standardisation
- Qualification & system reliability
The programme is complemented by an Table-Top-Exhibition.
Background
BAM and the German Society for Non-Destructive Testing have organised a series of events on Industrial Computed Tomography and Image Processing together with other partners since 1988. The sixth last symposium was held together with COFREND 2007 in Lyon, France.
Official Language
The official language for the technical programme, poster session and other events is English.
All contributions must be edited for English prior to submittal.
Table Top Presentation
Deadline April 30, 2011
The symposium is devoted to promote a broad exchange of information, applications, operations and quality assurance in the area of digital industrial radiology as well as computed tomography. The meeting provides a unique opportunity for users, scientists, equipment suppliers and all who are interested to discuss the present and future possibilities of new X-ray detectors and sources, image processing algorithms, volume scanning, geometrical feature extraction, local density distribution up to related methods like laminography and tomography with neutrons. The fee for table top presentation is 800.00 Euro plus Value Added Tax (VAT).
J. Goebbels
DGZfP Subcommittee
Computed Tomography
BAM Berlin, NDT, Micro NDE
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U. Zscherpel
DGZfP Subcommittee
Digital Radiology
BAM Berlin, NDT, Radiology
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